Millimeter wave transmission spectroscopy of gated two-dimensional hole systems

dc.citation.firstpage192104en_US
dc.citation.journalTitleApplied Physics Lettersen_US
dc.citation.volumeNumber100en_US
dc.contributor.authorStone, K.en_US
dc.contributor.authorDu, R.R.en_US
dc.contributor.authorManfra, M.J.en_US
dc.contributor.authorPfeiffer, L.N.en_US
dc.contributor.authorWest, K.W.en_US
dc.date.accessioned2013-03-14T19:08:36Zen_US
dc.date.available2013-03-14T19:08:36Zen_US
dc.date.issued2012en_US
dc.description.abstractWe developed a differential transmission to study cyclotron resonance of GaAs/AlxGa1 xAs two-dimensional hole samples. The technique utilizes a modulated AuPd gate isolated by a Si3N4 dielectric from the sample, which is irradiated opposite the gate by millimeter waves ranging from 2 to 40GHz. This technique effectively removes the background signal and yields a hole effective mass of 0:41me with a cyclotron scattering time of 20 ps, consistent with the previous results using different techniques.en_US
dc.embargo.termsnoneen_US
dc.identifier.citationStone, K., Du, R.R., Manfra, M.J., et al.. "Millimeter wave transmission spectroscopy of gated two-dimensional hole systems." <i>Applied Physics Letters,</i> 100, (2012) American Institute of Physics: 192104. http://dx.doi.org/10.1063/1.4711772.en_US
dc.identifier.doihttp://dx.doi.org/10.1063/1.4711772en_US
dc.identifier.urihttps://hdl.handle.net/1911/70635en_US
dc.language.isoengen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.titleMillimeter wave transmission spectroscopy of gated two-dimensional hole systemsen_US
dc.typeJournal articleen_US
dc.type.dcmiTexten_US
dc.type.publicationpublisher versionen_US
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