Measurement of pipe wall thickness using magnetic flux leakage signals

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dc.contributor.assigneeRice Universityen_US
dc.contributor.publisherUnited States Patent and Trademark Officeen_US
dc.creatorDutta, Sushant Madhukulen_US
dc.creatorGhorbel, Fathi Hassanen_US
dc.date.accessioned2015-05-04T19:05:59Zen_US
dc.date.available2015-05-04T19:05:59Zen_US
dc.date.filed2009-03-25en_US
dc.date.issued2012-03-13en_US
dc.description.abstractAn apparatus comprising a processor configured to implement a method comprising obtaining a pipe profile comprising a diameter, a nominal thickness, and a material, receiving a magnetic flux leakage (MFL) indication for a pipe associated with the pipe profile, and determining a wall thickness for the pipe using the pipe profile and the MFL indication. Also disclosed is a method comprising modeling an apparatus comprising a magnet configured to induce a magnetic field in a pipe, and determining a wall thickness measurement (WTM) for the pipe using a model of the apparatus and the pipe, a detected MFL signal, and a simulated MFL signal.en_US
dc.digitization.specificationsThis patent information was downloaded from the US Patent and Trademark website (http://www.uspto.gov/) as image-PDFs. The PDFs were OCRed for access purposes.en_US
dc.format.extent21 ppen_US
dc.identifier.citationDutta, Sushant Madhukul and Ghorbel, Fathi Hassan, "Measurement of pipe wall thickness using magnetic flux leakage signals." Patent US8134360B2. issued 2012-03-13. Retrieved from https://hdl.handle.net/1911/80085.en_US
dc.identifier.patentIDUS8134360B2en_US
dc.identifier.urihttps://hdl.handle.net/1911/80085en_US
dc.language.isoengen_US
dc.titleMeasurement of pipe wall thickness using magnetic flux leakage signalsen_US
dc.typeUtility patenten_US
dc.type.dcmiTexten_US
dc.type.genrepatentsen_US
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