An apparatus comprising a processor configured to implement a method comprising obtaining a pipe profile comprising a diameter, a nominal thickness, and a material, receiving a magnetic flux leakage (MFL) indication for a pipe associated with the pipe profile, and determining a wall thickness for the pipe using the pipe profile and the MFL indication. Also disclosed is a method comprising modeling an apparatus comprising a magnet configured to induce a magnetic field in a pipe, and determining a wall thickness measurement (WTM) for the pipe using a model of the apparatus and the pipe, a detected MFL signal, and a simulated MFL signal.