Noise in electromigrated nanojunctions

Simple item page
dc.citation.firstpage155411en_US
dc.citation.issueNumber15en_US
dc.citation.journalTitlePhysical Review Ben_US
dc.citation.volumeNumber87en_US
dc.contributor.authorWheeler, P.J.en_US
dc.contributor.authorChen, Ruoyuen_US
dc.contributor.authorNatelson, D.en_US
dc.date.accessioned2016-04-05T20:14:03Zen_US
dc.date.available2016-04-05T20:14:03Zen_US
dc.date.issued2013en_US
dc.description.abstractNoise measurements are a probe beyond simple electronic transport that can reveal additional information about electronic correlations and inelastic processes. Here we report noise measurements in individual electromigrated nanojunctions, examining the evolution from the many-channel regime to the tunneling regime, using a radio frequency technique. While we generally observe the dependence of noise on bias expected for shot noise, in approximately 12% of junction configurations we find discrete changes in the bias dependence at threshold values of the bias, consistent with electronic excitation of local vibrational modes. Moreover, with some regularity we find significant mesoscopic variation in the magnitude of the noise in particular junctions even with small changes in the accompanying conductance. In another ∼17% of junctions we observe pronounced asymmetries in the inferred noise magnitude as a function of bias polarity, suggesting that investigators should be concerned about current-driven ionic motion in the electrodes even at biases well below those used for deliberate electromigration.en_US
dc.identifier.citationWheeler, P.J., Chen, Ruoyu and Natelson, D.. "Noise in electromigrated nanojunctions." <i>Physical Review B,</i> 87, no. 15 (2013) American Physical Society: 155411. http://dx.doi.org/10.1103/PhysRevB.87.155411.en_US
dc.identifier.doihttp://dx.doi.org/10.1103/PhysRevB.87.155411en_US
dc.identifier.urihttps://hdl.handle.net/1911/88859en_US
dc.language.isoengen_US
dc.publisherAmerican Physical Societyen_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.titleNoise in electromigrated nanojunctionsen_US
dc.typeJournal articleen_US
dc.type.dcmiTexten_US
dc.type.publicationpublisher versionen_US
Files
Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
PhysRevB.87.155411.pdf
Size:
1.42 MB
Format:
Adobe Portable Document Format
Description:
Download
Collections
Faculty Publications
ECE Publications
Physics and Astronomy Publications