Characterization of polymeric surfaces and interfaces using time-of-flight secondary ion mass spectrometry

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dc.citation.firstpage1174
dc.citation.issueNumber7
dc.citation.journalTitleJournal of Polymer Science
dc.citation.lastpage1198
dc.citation.volumeNumber60
dc.contributor.authorMei, Hao
dc.contributor.authorLaws, Travis S.
dc.contributor.authorTerlier, Tanguy
dc.contributor.authorVerduzco, Rafael
dc.contributor.authorStein, Gila E.
dc.contributor.orgShared Equipment Authority
dc.date.accessioned2022-05-02T15:17:00Z
dc.date.available2022-05-02T15:17:00Z
dc.date.issued2022
dc.description.abstractTime-of-flight secondary ion mass spectrometry (ToF-SIMS) is used for chemical analysis of surfaces. ToF-SIMS is a powerful tool for polymer science because it detects a broad mass range with good mass resolution, thereby distinguishing between polymers that have similar elemental compositions and/or the same types of functional groups. Chemical labeling techniques that enhance contrast, such as deuterating or staining one constituent, are generally unnecessary. ToF-SIMS can generate both two-dimensional images and three-dimensional depth profiles, where each pixel in an image is associated with a complete mass spectrum. This Review begins by introducing the principles of ToF-SIMS measurements, including instrumentation, modes of operation, strategies for data analysis, and strengths/limitations when characterizing polymer surfaces. The sections that follow describe applications in polymer science that benefit from characterization by ToF-SIMS, including thin films and coatings, polymer blends, composites, and electronic materials. The examples selected for discussion showcase the three standard modes of operation (spectral analysis, imaging, and depth profiling) and highlight practical considerations that relate to experimental design and data processing. We conclude with brief comments about broader opportunities for ToF-SIMS in polymer science.
dc.identifier.citationMei, Hao, Laws, Travis S., Terlier, Tanguy, et al.. "Characterization of polymeric surfaces and interfaces using time-of-flight secondary ion mass spectrometry." <i>Journal of Polymer Science,</i> 60, no. 7 (2022) Wiley: 1174-1198. https://doi.org/10.1002/pol.20210282.
dc.identifier.doihttps://doi.org/10.1002/pol.20210282
dc.identifier.urihttps://hdl.handle.net/1911/112199
dc.language.isoeng
dc.publisherWiley
dc.rightsThis is an author's peer-reviewed final manuscript, as accepted by the publisher. The published article is copyrighted by Wiley.
dc.titleCharacterization of polymeric surfaces and interfaces using time-of-flight secondary ion mass spectrometry
dc.typeJournal article
dc.type.dcmiText
dc.type.publicationpost-print
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