Characterization of polymeric surfaces and interfaces using time-of-flight secondary ion mass spectrometry

dc.citation.firstpage1174en_US
dc.citation.issueNumber7en_US
dc.citation.journalTitleJournal of Polymer Scienceen_US
dc.citation.lastpage1198en_US
dc.citation.volumeNumber60en_US
dc.contributor.authorMei, Haoen_US
dc.contributor.authorLaws, Travis S.en_US
dc.contributor.authorTerlier, Tanguyen_US
dc.contributor.authorVerduzco, Rafaelen_US
dc.contributor.authorStein, Gila E.en_US
dc.contributor.orgShared Equipment Authorityen_US
dc.date.accessioned2022-05-02T15:17:00Zen_US
dc.date.available2022-05-02T15:17:00Zen_US
dc.date.issued2022en_US
dc.description.abstractTime-of-flight secondary ion mass spectrometry (ToF-SIMS) is used for chemical analysis of surfaces. ToF-SIMS is a powerful tool for polymer science because it detects a broad mass range with good mass resolution, thereby distinguishing between polymers that have similar elemental compositions and/or the same types of functional groups. Chemical labeling techniques that enhance contrast, such as deuterating or staining one constituent, are generally unnecessary. ToF-SIMS can generate both two-dimensional images and three-dimensional depth profiles, where each pixel in an image is associated with a complete mass spectrum. This Review begins by introducing the principles of ToF-SIMS measurements, including instrumentation, modes of operation, strategies for data analysis, and strengths/limitations when characterizing polymer surfaces. The sections that follow describe applications in polymer science that benefit from characterization by ToF-SIMS, including thin films and coatings, polymer blends, composites, and electronic materials. The examples selected for discussion showcase the three standard modes of operation (spectral analysis, imaging, and depth profiling) and highlight practical considerations that relate to experimental design and data processing. We conclude with brief comments about broader opportunities for ToF-SIMS in polymer science.en_US
dc.identifier.citationMei, Hao, Laws, Travis S., Terlier, Tanguy, et al.. "Characterization of polymeric surfaces and interfaces using time-of-flight secondary ion mass spectrometry." <i>Journal of Polymer Science,</i> 60, no. 7 (2022) Wiley: 1174-1198. https://doi.org/10.1002/pol.20210282.en_US
dc.identifier.doihttps://doi.org/10.1002/pol.20210282en_US
dc.identifier.urihttps://hdl.handle.net/1911/112199en_US
dc.language.isoengen_US
dc.publisherWileyen_US
dc.rightsThis is an author's peer-reviewed final manuscript, as accepted by the publisher. The published article is copyrighted by Wiley.en_US
dc.titleCharacterization of polymeric surfaces and interfaces using time-of-flight secondary ion mass spectrometryen_US
dc.typeJournal articleen_US
dc.type.dcmiTexten_US
dc.type.publicationpost-printen_US
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