Magnetic domain structures of focused ion beam-patterned cobalt films using scanning ion microscopy with polarization analysis

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dc.citation.firstpage6527
dc.citation.journalTitleJournal of Applied Physics
dc.citation.volumeNumber95
dc.contributor.authorLi, J.
dc.contributor.authorRau, C.
dc.contributor.orgRice Quantum Institute
dc.contributor.orgCenter for Nanoscience and Technology
dc.date.accessioned2015-04-30T16:55:43Z
dc.date.available2015-04-30T16:55:43Z
dc.date.issued2004
dc.description.abstractStudies of magnetic domain distributions in patterned magnetic materials are of pivotal importance in the areas of ultrahigh density magnetic recording, MRAM design, and miniaturized magnetic sensor arrays. Scanning ion microscopy with polarizationanalysis (SIMPA) is used to perform in situ topographic and magnetic domain imaging and focused ion beam(FIB) patterning. For FIB-patterned 30 nm thick Co films, it is found that rectangular Co bars of sizes between 10–30 μm exhibit S type, whereas circular shaped magnetic elements show C type micromagnetic magnetization patterns. It is shown that SIMPA provides a simple way to directly identify different micromagnetic domain patterns.
dc.identifier.citationLi, J. and Rau, C.. "Magnetic domain structures of focused ion beam-patterned cobalt films using scanning ion microscopy with polarization analysis." <i>Journal of Applied Physics,</i> 95, (2004) AIP Publishing LLC: 6527. http://dx.doi.org/10.1063/1.1689433.
dc.identifier.doihttp://dx.doi.org/10.1063/1.1689433
dc.identifier.urihttps://hdl.handle.net/1911/79700
dc.language.isoeng
dc.publisherAIP Publishing LLC
dc.rightsThis is an author's peer-reviewed final manuscript, as accepted by the publisher. The published article is copyrighted by AIP Publishing LLC.
dc.titleMagnetic domain structures of focused ion beam-patterned cobalt films using scanning ion microscopy with polarization analysis
dc.typeJournal article
dc.type.dcmiText
dc.type.publicationpost-print
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