Scanning-Ion Microscopy with Polarization Analysis (Simpa)

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dc.citation.firstpage723en_US
dc.citation.journalTitleMRS Proceedingsen_US
dc.citation.lastpage728en_US
dc.citation.volumeNumber313en_US
dc.contributor.authorZheng, N.J.en_US
dc.contributor.authorRau, C.en_US
dc.contributor.orgRice Quantum Instituteen_US
dc.date.accessioned2015-04-30T16:55:44Zen_US
dc.date.available2015-04-30T16:55:44Zen_US
dc.date.issued1993en_US
dc.description.abstractWe have developed a novel, high-resolution magnetic imaging technique, scanning-ion microscopy with polarization analysis (SIMP A). In SIMP A, a highly-focused, scanning Ga+ ion beam is used to excite spin-polarized electrons at surfaces of ferromagnetic materials. By measuring the intensity and the spin polarization of the emitted electrons using a newly developed, compact Mott polarimeter, topographic and magnetic images of magnetic structures are obtained. We report on first SIMP A studies on single crystalline Fe samples.en_US
dc.identifier.citationZheng, N.J. and Rau, C.. "Scanning-Ion Microscopy with Polarization Analysis (Simpa)." <i>MRS Proceedings,</i> 313, (1993) Cambridge University Press: 723-728. http://dx.doi.org/10.1557/PROC-313-723.en_US
dc.identifier.doihttp://dx.doi.org/10.1557/PROC-313-723en_US
dc.identifier.urihttps://hdl.handle.net/1911/79704en_US
dc.language.isoengen_US
dc.publisherCambridge University Pressen_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.titleScanning-Ion Microscopy with Polarization Analysis (Simpa)en_US
dc.typeJournal articleen_US
dc.type.dcmiTexten_US
dc.type.publicationpublisher versionen_US
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