Shot noise detection in hBN-based tunnel junctions

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dc.citation.articleNumber133106en_US
dc.citation.issueNumber13en_US
dc.citation.journalTitleApplied Physics Lettersen_US
dc.citation.volumeNumber110en_US
dc.contributor.authorZhou, Panpanen_US
dc.contributor.authorHardy, Will J.en_US
dc.contributor.authorWatanabe, Kenjien_US
dc.contributor.authorTaniguchi, Takashien_US
dc.contributor.authorNatelson, Douglasen_US
dc.contributor.orgApplied Physics Programen_US
dc.contributor.orgSmalley-Curl Instituteen_US
dc.date.accessioned2017-04-04T17:30:17Zen_US
dc.date.available2017-04-04T17:30:17Zen_US
dc.date.issued2017en_US
dc.description.abstractHigh quality Au/hBN/Au tunnel devices are fabricated using transferred atomically thin hexagonal boron nitride as the tunneling barrier. All tunnel junctions show tunneling resistance on the order of several kΩ/μm2. Ohmic I-V curves at small bias with no signs of resonances indicate the sparsity of defects. Tunneling current shot noise is measured in these devices, and the excess shot noise shows consistency with theoretical expectations. These results show that atomically thin hBN is an excellent tunnel barrier, especially for the study of shot noise properties, and this can enable the study of the tunneling density of states and shot noise spectroscopy in more complex systems.en_US
dc.identifier.citationZhou, Panpan, Hardy, Will J., Watanabe, Kenji, et al.. "Shot noise detection in hBN-based tunnel junctions." <i>Applied Physics Letters,</i> 110, no. 13 (2017) AIP Publishing: http://dx.doi.org/10.1063/1.4978693.en_US
dc.identifier.doihttp://dx.doi.org/10.1063/1.4978693en_US
dc.identifier.urihttps://hdl.handle.net/1911/94053en_US
dc.language.isoengen_US
dc.publisherAIP Publishingen_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.titleShot noise detection in hBN-based tunnel junctionsen_US
dc.typeJournal articleen_US
dc.type.dcmiTexten_US
dc.type.publicationpublisher versionen_US
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