Noncontact conductivity and dielectric measurement for high throughput roll-to-roll nanomanufacturing

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dc.citation.articleNumber17019en_US
dc.citation.journalTitleScientific Reportsen_US
dc.citation.volumeNumber5en_US
dc.contributor.authorOrloff, Nathan D.en_US
dc.contributor.authorLong, Christian J.en_US
dc.contributor.authorObrzut, Janen_US
dc.contributor.authorMaillaud, Laurenten_US
dc.contributor.authorMirri, Francescaen_US
dc.contributor.authorKole, Thomas P.en_US
dc.contributor.authorMcMichael, Robert D.en_US
dc.contributor.authorPasquali, Matteoen_US
dc.contributor.authorStranick, Stephan J.en_US
dc.contributor.authorLiddle, J. Alexanderen_US
dc.contributor.orgSmalley Institute for Nanoscale Science and Technologyen_US
dc.date.accessioned2017-05-12T17:10:13Zen_US
dc.date.available2017-05-12T17:10:13Zen_US
dc.date.issued2015en_US
dc.description.abstractAdvances in roll-to-roll processing of graphene and carbon nanotubes have at last led to the continuous production of high-quality coatings and filaments, ushering in a wave of applications for flexible and wearable electronics, woven fabrics, and wires. These applications often require specific electrical properties, and hence precise control over material micro- and nanostructure. While such control can be achieved, in principle, by closed-loop processing methods, there are relatively few noncontact and nondestructive options for quantifying the electrical properties of materials on a moving web at the speed required in modern nanomanufacturing. Here, we demonstrate a noncontact microwave method for measuring the dielectric constant and conductivity (or geometry for samples of known dielectric properties) of materials in a millisecond. Such measurement times are compatible with current and future industrial needs, enabling real-time materials characterization and in-line control of processing variables without disrupting production.en_US
dc.identifier.citationOrloff, Nathan D., Long, Christian J., Obrzut, Jan, et al.. "Noncontact conductivity and dielectric measurement for high throughput roll-to-roll nanomanufacturing." <i>Scientific Reports,</i> 5, (2015) Springer Nature: http://dx.doi.org/10.1038/srep17019.en_US
dc.identifier.doihttp://dx.doi.org/10.1038/srep17019en_US
dc.identifier.urihttps://hdl.handle.net/1911/94245en_US
dc.language.isoengen_US
dc.publisherSpringer Natureen_US
dc.rightsThis work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the maen_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/en_US
dc.titleNoncontact conductivity and dielectric measurement for high throughput roll-to-roll nanomanufacturingen_US
dc.typeJournal articleen_US
dc.type.dcmiTexten_US
dc.type.publicationpublisher versionen_US
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