Noncontact conductivity and dielectric measurement for high throughput roll-to-roll nanomanufacturing

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dc.citation.articleNumber17019
dc.citation.journalTitleScientific Reports
dc.citation.volumeNumber5
dc.contributor.authorOrloff, Nathan D.
dc.contributor.authorLong, Christian J.
dc.contributor.authorObrzut, Jan
dc.contributor.authorMaillaud, Laurent
dc.contributor.authorMirri, Francesca
dc.contributor.authorKole, Thomas P.
dc.contributor.authorMcMichael, Robert D.
dc.contributor.authorPasquali, Matteo
dc.contributor.authorStranick, Stephan J.
dc.contributor.authorLiddle, J. Alexander
dc.contributor.orgSmalley Institute for Nanoscale Science and Technology
dc.date.accessioned2017-05-12T17:10:13Z
dc.date.available2017-05-12T17:10:13Z
dc.date.issued2015
dc.description.abstractAdvances in roll-to-roll processing of graphene and carbon nanotubes have at last led to the continuous production of high-quality coatings and filaments, ushering in a wave of applications for flexible and wearable electronics, woven fabrics, and wires. These applications often require specific electrical properties, and hence precise control over material micro- and nanostructure. While such control can be achieved, in principle, by closed-loop processing methods, there are relatively few noncontact and nondestructive options for quantifying the electrical properties of materials on a moving web at the speed required in modern nanomanufacturing. Here, we demonstrate a noncontact microwave method for measuring the dielectric constant and conductivity (or geometry for samples of known dielectric properties) of materials in a millisecond. Such measurement times are compatible with current and future industrial needs, enabling real-time materials characterization and in-line control of processing variables without disrupting production.
dc.identifier.citationOrloff, Nathan D., Long, Christian J., Obrzut, Jan, et al.. "Noncontact conductivity and dielectric measurement for high throughput roll-to-roll nanomanufacturing." <i>Scientific Reports,</i> 5, (2015) Springer Nature: http://dx.doi.org/10.1038/srep17019.
dc.identifier.doihttp://dx.doi.org/10.1038/srep17019
dc.identifier.urihttps://hdl.handle.net/1911/94245
dc.language.isoeng
dc.publisherSpringer Nature
dc.rightsThis work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the ma
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.titleNoncontact conductivity and dielectric measurement for high throughput roll-to-roll nanomanufacturing
dc.typeJournal article
dc.type.dcmiText
dc.type.publicationpublisher version
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