A contactless method of measuring the resistivity of semiconductor materials

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dc.creatorCrowley, James Duaneen_US
dc.date.accessioned2016-04-21T12:01:57Zen_US
dc.date.available2016-04-21T12:01:57Zen_US
dc.date.issued1972en_US
dc.description.abstractA study has been made of a contactless technique of measuring resistivity, which uses a time-varying magnetic field to induce eddy currents in a sample and measures the magnetic field produced by the eddy currents. The theoretical basis of this method is studied. An experimental system using a phase discriminating network is developed, and used to measure a voltage induced by the eddy current magnetic field. Data are reported for samples in the range from 0.1 to 11 ohm-cm. This method is predicted to be feasible for measuring resistivities in the range from 10-10 ohm-cm to 10+6 ohm-cm.en_US
dc.format.digitalOriginreformatted digitalen_US
dc.format.extent97 ppen_US
dc.identifier.callnoThesis E.E. 1972 CROWLEYen_US
dc.identifier.citationCrowley, James Duane. "A contactless method of measuring the resistivity of semiconductor materials." (1972) Master’s Thesis, Rice University. <a href="https://hdl.handle.net/1911/89244">https://hdl.handle.net/1911/89244</a>.en_US
dc.identifier.digitalRICE0281en_US
dc.identifier.urihttps://hdl.handle.net/1911/89244en_US
dc.language.isoengen_US
dc.rightsCopyright is held by the author, unless otherwise indicated. Permission to reuse, publish, or reproduce the work beyond the bounds of fair use or other exemptions to copyright law must be obtained from the copyright holder.en_US
dc.titleA contactless method of measuring the resistivity of semiconductor materialsen_US
dc.typeThesisen_US
dc.type.materialTexten_US
thesis.degree.departmentElectrical Engineeringen_US
thesis.degree.disciplineEngineeringen_US
thesis.degree.grantorRice Universityen_US
thesis.degree.levelMastersen_US
thesis.degree.nameMaster of Scienceen_US
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