A contactless method of measuring the resistivity of semiconductor materials

Date
1972
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract

A study has been made of a contactless technique of measuring resistivity, which uses a time-varying magnetic field to induce eddy currents in a sample and measures the magnetic field produced by the eddy currents. The theoretical basis of this method is studied. An experimental system using a phase discriminating network is developed, and used to measure a voltage induced by the eddy current magnetic field. Data are reported for samples in the range from 0.1 to 11 ohm-cm. This method is predicted to be feasible for measuring resistivities in the range from 10-10 ohm-cm to 10+6 ohm-cm.

Description
Advisor
Degree
Master of Science
Type
Thesis
Keywords
Citation

Crowley, James Duane. "A contactless method of measuring the resistivity of semiconductor materials." (1972) Master’s Thesis, Rice University. https://hdl.handle.net/1911/89244.

Has part(s)
Forms part of
Published Version
Rights
Copyright is held by the author, unless otherwise indicated. Permission to reuse, publish, or reproduce the work beyond the bounds of fair use or other exemptions to copyright law must be obtained from the copyright holder.
Link to license
Citable link to this page