Risk analysis for data-intensive stochastic models

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dc.contributor.assigneeInternational Business Machines Corporationen_US
dc.contributor.assigneeRice Universityen_US
dc.contributor.assigneeUniversity of Floridaen_US
dc.contributor.publisherUnited States Patent and Trademark Officeen_US
dc.creatorArumugam, Subramanianen_US
dc.creatorHaas, Peter J.en_US
dc.creatorJampani, Ravindranath Chowdaryen_US
dc.creatorJermaine, Christopheren_US
dc.creatorPerez, Luis L.en_US
dc.creatorXu, Feien_US
dc.date.accessioned2015-05-04T19:06:02Z
dc.date.available2015-05-04T19:06:02Z
dc.date.filed2011-09-13en_US
dc.date.issued2012-12-25en_US
dc.description.abstractA risk analysis system and method are provided. The system includes an analyzer for analyzing database instances by executing a query on each database instance and selecting a cutoff value. The analyzer also discards the sets of uncertainty data that yield query-result values below the cutoff value and retains the database instances that yield query-result values above the cutoff value as elite sets. The system also includes a cloner to replicate the elite sets, and a sampler to modify the elite sets so that each elite set is mutually statistically independent while still yielding query-result values above the cutoff value.en_US
dc.digitization.specificationsThis patent information was downloaded from the US Patent and Trademark website (http://www.uspto.gov/) as image-PDFs. The PDFs were OCRed for access purposes.en_US
dc.format.extent14 ppen_US
dc.identifier.citationArumugam, Subramanian, Haas, Peter J., Jampani, Ravindranath Chowdary, Jermaine, Christopher, Perez, Luis L. and Xu, Fei, "Risk analysis for data-intensive stochastic models." Patent US8341180B1. issued 2012-12-25. Retrieved from https://hdl.handle.net/1911/80112.
dc.identifier.patentIDUS8341180B1en_US
dc.identifier.urihttps://hdl.handle.net/1911/80112
dc.language.isoengen_US
dc.titleRisk analysis for data-intensive stochastic modelsen_US
dc.typeUtility patenten_US
dc.type.dcmiTexten_US
dc.type.genrepatentsen_US
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