Fourier transform infrared spectroscopy of 6.1-Angstrom semiconductor quantum wells

Date
2002
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Abstract

The 6.1-Angstrom (A) family of III-V semiconductors---InAs, GaSb, and AlSb and their alloys and heterostructures---has unique properties that may find application in next generation multi-functional semiconductor devices. In this project, we investigate intersubband transitions in 6.1-A quantum wells. The short-term objective is to explore high-photon-energy (or short-wavelength) intersubband transitions that are expected to occur in these systems due to their extremely large conduction-band offsets. The ultimate goal of this project is to construct a solid-state terahertz (THz) emitter based on 6.1-A quantum wells under intersubband pumping. We have established reliable and reproducible sample preparation methods for measuring intersubband transitions using Fourier-transform infrared spectroscopy. In particular, we observed intersubband transitions in 6.1-A quantum wells in a previously unexplored short-wavelength range. We systematically studied intersubband transition energies, intensities, and linewidths as functions of well width and temperature, and compared the results with calculations based on an 8-band k·p theory. Experimental methods, experimental results, and discussion will be presented in detail. Furthermore, transmission electron microscopy (TEM) was used to assess the quality of interfaces in 6.1-A quantum wells. A description is given for the sample preparation procedure together with some TEM pictures.

Description
Degree
Master of Science
Type
Thesis
Keywords
Electronics, Electrical engineering, Condensed matter physics, Optics
Citation

Tang, Jun. "Fourier transform infrared spectroscopy of 6.1-Angstrom semiconductor quantum wells." (2002) Master’s Thesis, Rice University. https://hdl.handle.net/1911/17554.

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