Atomistic measurement and modeling of intrinsic fracture toughness of two-dimensional materials

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dc.citation.articleNumbere2206756119en_US
dc.citation.issueNumber45en_US
dc.citation.journalTitleProceedings of the National Academy of Sciencesen_US
dc.citation.volumeNumber119en_US
dc.contributor.authorZhang, Xuen_US
dc.contributor.authorNguyen, Hoangen_US
dc.contributor.authorZhang, Xiangen_US
dc.contributor.authorAjayan, Pulickel M.en_US
dc.contributor.authorWen, Jianguoen_US
dc.contributor.authorEspinosa, Horacio D.en_US
dc.date.accessioned2022-12-13T19:11:29Zen_US
dc.date.available2022-12-13T19:11:29Zen_US
dc.date.issued2022en_US
dc.description.abstractQuantifying the intrinsic mechanical properties of two-dimensional (2D) materials is essential to predict the long-term reliability of materials and systems in emerging applications ranging from energy to health to next-generation sensors and electronics. Currently, measurements of fracture toughness and identification of associated atomistic mechanisms remain challenging. Herein, we report an integrated experimental–computational framework in which in-situ high-resolution transmission electron microscopy (HRTEM) measurements of the intrinsic fracture energy of monolayer MoS 2 and MoSe 2 are in good agreement with atomistic model predictions based on an accurately parameterized interatomic potential. Changes in crystalline structures at the crack tip and crack edges, as observed in in-situ HRTEM crack extension tests, are properly predicted. Such a good agreement is the result of including large deformation pathways and phase transitions in the parameterization of the inter-atomic potential. The established framework emerges as a robust approach to determine the predictive capabilities of molecular dynamics models employed in the screening of 2D materials, in the spirit of the materials genome initiative. Moreover, it enables device-level predictions with superior accuracy (e.g., fatigue lifetime predictions of electro- and opto-electronic nanodevices).en_US
dc.identifier.citationZhang, Xu, Nguyen, Hoang, Zhang, Xiang, et al.. "Atomistic measurement and modeling of intrinsic fracture toughness of two-dimensional materials." <i>Proceedings of the National Academy of Sciences,</i> 119, no. 45 (2022) PNAS: https://doi.org/10.1073/pnas.2206756119.en_US
dc.identifier.digitalpnas-2206756119en_US
dc.identifier.doihttps://doi.org/10.1073/pnas.2206756119en_US
dc.identifier.urihttps://hdl.handle.net/1911/114112en_US
dc.language.isoengen_US
dc.publisherPNASen_US
dc.rightsThis article is distributed under Creative Commons Attribution-NonCommercial-NoDerivatives License 4.0 (CC BY-NC-ND).en_US
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/4.0/en_US
dc.titleAtomistic measurement and modeling of intrinsic fracture toughness of two-dimensional materialsen_US
dc.typeJournal articleen_US
dc.type.dcmiTexten_US
dc.type.publicationpublisher versionen_US
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