Deep imaging in scattering media with selective plane illumination microscopy

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dc.citation.articleNumber126009en_US
dc.citation.issueNumber12en_US
dc.citation.journalTitleJournal of Biomedical Opticsen_US
dc.citation.volumeNumber21en_US
dc.contributor.authorPediredla, Adithya Kumaren_US
dc.contributor.authorZhang, Shizhengen_US
dc.contributor.authorAvants, Benen_US
dc.contributor.authorYe, Fanen_US
dc.contributor.authorNagayama, Shinen_US
dc.contributor.authorChen, Ziyingen_US
dc.contributor.authorKemere, Caleben_US
dc.contributor.authorRobinson, Jacob T.en_US
dc.contributor.authorVeeraraghavan, Ashoken_US
dc.date.accessioned2017-01-27T19:05:16Zen_US
dc.date.available2017-01-27T19:05:16Zen_US
dc.date.issued2016en_US
dc.description.abstractIn most biological tissues, light scattering due to small differences in refractive index limits the depth of optical imaging systems. Two-photon microscopy (2PM), which significantly reduces the scattering of the excitation light, has emerged as the most common method to image deep within scattering biological tissue. This technique, however, requires high-power pulsed lasers that are both expensive and difficult to integrate into compact portable systems. Using a combination of theoretical and experimental techniques, we show that if the excitation path length can be minimized, selective plane illumination microscopy (SPIM) can image nearly as deep as 2PM without the need for a high-powered pulsed laser. Compared to other single-photon imaging techniques like epifluorescence and confocal microscopy, SPIM can image more than twice as deep in scattering media (∼10 times the mean scattering length). These results suggest that SPIM has the potential to provide deep imaging in scattering media in situations in which 2PM systems would be too large or costly.en_US
dc.identifier.citationPediredla, Adithya Kumar, Zhang, Shizheng, Avants, Ben, et al.. "Deep imaging in scattering media with selective plane illumination microscopy." <i>Journal of Biomedical Optics,</i> 21, no. 12 (2016) SPIE: http://dx.doi.org/10.1117/1.JBO.21.12.126009.en_US
dc.identifier.doihttp://dx.doi.org/10.1117/1.JBO.21.12.126009en_US
dc.identifier.urihttps://hdl.handle.net/1911/93786en_US
dc.language.isoengen_US
dc.publisherSPIEen_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.titleDeep imaging in scattering media with selective plane illumination microscopyen_US
dc.typeJournal articleen_US
dc.type.dcmiTexten_US
dc.type.publicationpublisher versionen_US
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