Material parameter estimation and imaging with terahertz time-domain spectroscopy

dc.contributor.advisorBaraniuk, Richard G.en_US
dc.creatorDorney, Timothy Dominicen_US
dc.date.accessioned2009-06-04T08:09:47Zen_US
dc.date.available2009-06-04T08:09:47Zen_US
dc.date.issued2002en_US
dc.description.abstractTerahertz time-domain spectroscopy (THz-TDS) offers a range of unique imaging modalities due to the broad bandwidth, sub-picosecond duration, and phase-sensitive detection of the THz pulses. Previous research in the THz field primarily focused on improving the optoelectronics and on qualitative investigation of suitable applications. In this thesis, we use a quantitative approach to explore and extend the boundaries of the system. First, the possibility exists to combine spectroscopic characterization and/or identification with imaging because the THz radiation is broadband in nature. We describe a robust algorithm for extracting the optical constants and thickness, simultaneously and independently, from a sample. The technique extracts material parameters for both high and low index materials. Second, a fiber-coupled THz system provides an unparalleled opportunity to simulate seismic data collection. We demonstrate the homology between ultra-wideband seismic and THz imaging using multistatic reflective data acquisition. These results broaden the capabilities of THz imaging by borrowing from a mature imaging community. We investigate the resolution limits and show results from both simple and complex layered targets.en_US
dc.format.extent96 p.en_US
dc.format.mimetypeapplication/pdfen_US
dc.identifier.callnoTHESIS E.E. 2002 DORNEYen_US
dc.identifier.citationDorney, Timothy Dominic. "Material parameter estimation and imaging with terahertz time-domain spectroscopy." (2002) Diss., Rice University. <a href="https://hdl.handle.net/1911/18074">https://hdl.handle.net/1911/18074</a>.en_US
dc.identifier.urihttps://hdl.handle.net/1911/18074en_US
dc.language.isoengen_US
dc.rightsCopyright is held by the author, unless otherwise indicated. Permission to reuse, publish, or reproduce the work beyond the bounds of fair use or other exemptions to copyright law must be obtained from the copyright holder.en_US
dc.subjectElectronicsen_US
dc.subjectElectrical engineeringen_US
dc.subjectOpticsen_US
dc.titleMaterial parameter estimation and imaging with terahertz time-domain spectroscopyen_US
dc.typeThesisen_US
dc.type.materialTexten_US
thesis.degree.departmentElectrical Engineeringen_US
thesis.degree.disciplineEngineeringen_US
thesis.degree.grantorRice Universityen_US
thesis.degree.levelDoctoralen_US
thesis.degree.nameDoctor of Philosophyen_US
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