An Improved Multifractal Formalism and Self Affine Measures

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dc.citation.bibtexNamephdthesisen_US
dc.citation.journalTitlePh.D. Thesisen_US
dc.contributor.orgDigital Signal Processing (http://dsp.rice.edu/)en_US
dc.creatorRiedi, Rudolf H.en_US
dc.date.accessioned2007-10-31T01:00:54Zen_US
dc.date.available2007-10-31T01:00:54Zen_US
dc.date.issued1993-01-20en_US
dc.date.modified2004-01-22en_US
dc.date.submitted2004-01-14en_US
dc.descriptionPhD Thesisen_US
dc.description.abstractThis document is a six page summary of my Ph.D. thesis in which multifractal formalism based on counting on coarse levels (as opposed to a dimensional approach) is developed. This formalism is then applied to self-affine measures discovering phase transitions which are not present with self-similar measures.en_US
dc.identifier.citation "An Improved Multifractal Formalism and Self Affine Measures," <i>Ph.D. Thesis,</i> 1993.en_US
dc.identifier.urihttps://hdl.handle.net/1911/20261en_US
dc.language.isoengen_US
dc.subjectTemporaryen_US
dc.subject.keywordTemporaryen_US
dc.subject.otherMultifractalsen_US
dc.titleAn Improved Multifractal Formalism and Self Affine Measuresen_US
dc.typeThesisen_US
dc.type.dcmiTexten_US
thesis.degree.levelDoctoralen_US
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