Snapshot advantage: a review of the light collection improvement for parallel high-dimensional measurement systems
| dc.citation.issueNumber | 11 | en_US |
| dc.citation.journalTitle | Optical Engineering | en_US |
| dc.citation.volumeNumber | 51 | en_US |
| dc.contributor.author | Hagen, Nathan | en_US |
| dc.contributor.author | Kester, Robert T. | en_US |
| dc.contributor.author | Gao, Liang | en_US |
| dc.contributor.author | Tkaczyk, Tomasz S. | en_US |
| dc.date.accessioned | 2013-08-20T22:58:33Z | en_US |
| dc.date.available | 2013-08-20T22:58:33Z | en_US |
| dc.date.issued | 2012 | en_US |
| dc.description.abstract | The snapshot advantage is a large increase in light collection efficiency available to highdimensional measurement systems that avoid filtering and scanning. After discussing this advantage in the context of imaging spectrometry, where the greatest effort towards developing snapshot systems has been made, we describe the types of measurements where it is applicable. We then generalize it to the larger context of high-dimensional measurements, where the advantage increases geometrically with measurement dimensionality. | en_US |
| dc.embargo.terms | none | en_US |
| dc.identifier.citation | Hagen, Nathan, Kester, Robert T., Gao, Liang, et al.. "Snapshot advantage: a review of the light collection improvement for parallel high-dimensional measurement systems." <i>Optical Engineering,</i> 51, no. 11 (2012) Society of Photo-Optical Instrumentation Engineers: http://dx.doi.org/10.1117/1.OE.51.11.111702. | en_US |
| dc.identifier.doi | http://dx.doi.org/10.1117/1.OE.51.11.111702 | en_US |
| dc.identifier.uri | https://hdl.handle.net/1911/71754 | en_US |
| dc.language.iso | eng | en_US |
| dc.publisher | Society of Photo-Optical Instrumentation Engineers | en_US |
| dc.rights | This is an author's peer-reviewed final manuscript, as accepted by the publisher. The published article is copyrighted by the Society of Photo-Optical Instrumentation Engineers. | en_US |
| dc.subject.keyword | snapshot | en_US |
| dc.subject.keyword | imaging spectrometry | en_US |
| dc.subject.keyword | high-dimensional systems | en_US |
| dc.subject.keyword | advantage | en_US |
| dc.subject.keyword | throughput | en_US |
| dc.title | Snapshot advantage: a review of the light collection improvement for parallel high-dimensional measurement systems | en_US |
| dc.type | Journal article | en_US |
| dc.type.dcmi | Text | en_US |
| dc.type.publication | post-print | en_US |