Browsing by Author "Wang, M."

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    A next-generation liquid xenon observatory for dark matter and neutrino physics
    (IOP Publishing, 2022) Aalbers, J.; AbdusSalam, S.S.; Abe, K.; Aerne, V.; Agostini, F.; Maouloud, S. Ahmed; Akerib, D.S.; Akimov, D.Y.; Akshat, J.; Musalhi, A.K. Al; Alder, F.; Alsum, S.K.; Althueser, L.; Amarasinghe, C.S.; Amaro, F.D.; Ames, A.; Anderson, T.J.; Andrieu, B.; Angelides, N.; Angelino, E.; Angevaare, J.; Antochi, V.C.; Martin, D. Antón; Antunovic, B.; Aprile, E.; Araújo, H.M.; Armstrong, J.E.; Arneodo, F.; Arthurs, M.; Asadi, P.; Baek, S.; Bai, X.; Bajpai, D.; Baker, A.; Balajthy, J.; Balashov, S.; Balzer, M.; Bandyopadhyay, A.; Bang, J.; Barberio, E.; Bargemann, J.W.; Baudis, L.; Bauer, D.; Baur, D.; Baxter, A.; Baxter, A.L.; Bazyk, M.; Beattie, K.; Behrens, J.; Bell, N.F.; Bellagamba, L.; Beltrame, P.; Benabderrahmane, M.; Bernard, E.P.; Bertone, G.F.; Bhattacharjee, P.; Bhatti, A.; Biekert, A.; Biesiadzinski, T.P.; Binau, A.R.; Biondi, R.; Biondi, Y.; Birch, H.J.; Bishara, F.; Bismark, A.; Blanco, C.; Blockinger, G.M.; Bodnia, E.; Boehm, C.; Bolozdynya, A.I.; Bolton, P.D.; Bottaro, S.; Bourgeois, C.; Boxer, B.; Brás, P.; Breskin, A.; Breur, P. A.; Brew, C.A.J.; Brod, J.; Brookes, E.; Brown, A.; Brown, E.; Bruenner, S.; Bruno, G.; Budnik, R.; Bui, T.K.; Burdin, S.; Buse, S.; Busenitz, J.K.; Buttazzo, D.; Buuck, M.; Buzulutskov, A.; Cabrita, R.; Cai, C.; Cai, D.; Capelli, C.; Cardoso, J.M.R.; Carmona-Benitez, M.C.; Cascella, M.; Catena, R.; Chakraborty, S.; Chan, C.; Chang, S.; Chauvin, A.; Chawla, A.; Chen, H.; Chepel, V.; Chott, N.I.; Cichon, D.; Chavez, A. Cimental; Cimmino, B.; Clark, M.; Co, R.T.; Colijn, A.P.; Conrad, J.; Converse, M.V.; Costa, M.; Cottle, A.; Cox, G.; Creaner, O.; Garcia, J.J. Cuenca; Cussonneau, J.P.; Cutter, J.E.; Dahl, C.E.; D’Andrea, V.; David, A.; Decowski, M.P.; Dent, J.B.; Deppisch, F.F.; Viveiros, L. de; Gangi, P. Di; Giovanni, A. Di; Pede, S. Di; Dierle, J.; Diglio, S.; Dobson, J.E.Y.; Doerenkamp, M.; Douillet, D.; Drexlin, G.; Druszkiewicz, E.; Dunsky, D.; Eitel, K.; Elykov, A.; Emken, T.; Engel, R.; Eriksen, S.R.; Fairbairn, M.; Fan, A.; Fan, J.J.; Farrell, S.J.; Fayer, S.; Fearon, N.M.; Ferella, A.; Ferrari, C.; Fieguth, A.; Fieguth, A.; Fiorucci, S.; Fischer, H.; Flaecher, H.; Flierman, M.; Florek, T.; Foot, R.; Fox, P.J.; Franceschini, R.; Fraser, E.D.; Frenk, C.S.; Frohlich, S.; Fruth, T.; Fulgione, W.; Fuselli, C.; Gaemers, P.; Gaior, R.; Gaitskell, R.J.; Galloway, M.; Gao, F.; Garcia, I. Garcia; Genovesi, J.; Ghag, C.; Ghosh, S.; Gibson, E.; Gil, W.; Giovagnoli, D.; Girard, F.; Glade-Beucke, R.; Glück, F.; Gokhale, S.; Gouvêa, A. de; Gráf, L.; Grandi, L.; Grigat, J.; Grinstein, B.; Grinten, M.G.D. van der; Grössle, R.; Guan, H.; Guida, M.; Gumbsheimer, R.; Gwilliam, C. B.; Hall, C.R.; Hall, L.J.; Hammann, R.; Han, K.; Hannen, V.; Hansmann-Menzemer, S.; Harata, R.; Hardin, S.P.; Hardy, E.; Hardy, C.A.; Harigaya, K.; Harnik, R.; Haselschwardt, S.J.; Hernandez, M.; Hertel, S.A.; Higuera, A.; Hils, C.; Hochrein, S.; Hoetzsch, L.; Hoferichter, M.; Hood, N.; Hooper, D.; Horn, M.; Howlett, J.; Huang, D.Q.; Huang, Y.; Hunt, D.; Iacovacci, M.; Iaquaniello, G.; Ide, R.; Ignarra, C.M.; Iloglu, G.; Itow, Y.; Jacquet, E.; Jahangir, O.; Jakob, J.; James, R.S.; Jansen, A.; Ji, W.; Ji, X.; Joerg, F.; Johnson, J.; Joy, A.; Kaboth, A.C.; Kalhor, L.; Kamaha, A.C.; Kanezaki, K.; Kar, K.; Kara, M.; Kato, N.; Kavrigin, P.; Kazama, S.; Keaveney, A.W.; Kellerer, J.; Khaitan, D.; Khazov, A.; Khundzakishvili, G.; Khurana, I.; Kilminster, B.; Kleifges, M.; Ko, P.; Kobayashi, M.; Kodroff, D.; Koltmann, G.; Kopec, A.; Kopmann, A.; Kopp, J.; Korley, L.; Kornoukhov, V.N.; Korolkova, E.V.; Kraus, H.; Krauss, L.M.; Kravitz, S.; Kreczko, L.; Kudryavtsev, V.A.; Kuger, F.; Kumar, J.; Paredes, B. López; LaCascio, L.; Laha, R.; Laine, Q.; Landsman, H.; Lang, R.F.; Leason, E.A.; Lee, J.; Leonard, D.S.; Lesko, K.T.; Levinson, L.; Levy, C.; Li, I.; Li, S.C.; Li, T.; Liang, S.; Liebenthal, C.S.; Lin, J.; Lin, Q.; Lindemann, S.; Lindner, M.; Lindote, A.; Linehan, R.; Lippincott, W.H.; Liu, X.; Liu, K.; Liu, J.; Loizeau, J.; Lombardi, F.; Long, J.; Lopes, M.I.; Asamar, E. Lopez; Lorenzon, W.; Lu, C.; Luitz, S.; Ma, Y.; Machado, P.A.N.; Macolino, C.; Maeda, T.; Mahlstedt, J.; Majewski, P.A.; Manalaysay, A.; Mancuso, A.; Manenti, L.; Manfredini, A.; Mannino, R.L.; Marangou, N.; March-Russell, J.; Marignetti, F.; Undagoitia, T. Marrodán; Martens, K.; Martin, R.; Martinez-Soler, I.; Masbou, J.; Masson, D.; Masson, E.; Mastroianni, S.; Mastronardi, M.; Matias-Lopes, J.A.; McCarthy, M.E.; McFadden, N.; McGinness, E.; McKinsey, D.N.; McLaughlin, J.; McMichael, K.; Meinhardt, P.; Menéndez, J.; Meng, Y.; Messina, M.; Midha, R.; Milisavljevic, D.; Miller, E.H.; Milosevic, B.; Milutinovic, S.; Mitra, S.A.; Miuchi, K.; Mizrachi, E.; Mizukoshi, K.; Molinario, A.; Monte, A.; Monteiro, C.M.B.; Monzani, M.E.; Moore, J.S.; Morå, K.; Morad, J.A.; Mendoza, J.D. Morales; Moriyama, S.; Morrison, E.; Morteau, E.; Mosbacher, Y.; Mount, B.J.; Mueller, J.; Murphy, A. St J.; Murra, M.; Naim, D.; Nakamura, S.; Nash, E.; Navaieelavasani, N.; Naylor, A.; Nedlik, C.; Nelson, H.N.; Neves, F.; Newstead, J.L.; Ni, K.; Nikoleyczik, J.A.; Niro, V.; Oberlack, U.G.; Obradovic, M.; Odgers, K.; O’Hare, C.A.J.; Oikonomou, P.; Olcina, I.; Oliver-Mallory, K.; Oranday, A.; Orpwood, J.; Ostrovskiy, I.; Ozaki, K.; Paetsch, B.; Pal, S.; Palacio, J.; Palladino, K.J.; Palmer, J.; Panci, P.; Pandurovic, M.; Parlati, A.; Parveen, N.; Patton, S.J.; Pěč, V.; Pellegrini, Q.; Penning, B.; Pereira, G.; Peres, R.; Perez-Gonzalez, Y.; Perry, E.; Pershing, T.; Petrossian-Byrne, R.; Pienaar, J.; Piepke, A.; Pieramico, G.; Pierre, M.; Piotter, M.; Pizzella, V.; Plante, G.; Pollmann, T.; Porzio, D.; Qi, J.; Qie, Y.; Qin, J.; Quevedo, F.; Raj, N.; Silva, M. Rajado; Ramanathan, K.; García, D. Ramírez; Ravanis, J.; Redard-Jacot, L.; Redigolo, D.; Reichard, S.; Reichenbacher, J.; Rhyne, C.A.; Richards, A.; Riffard, Q.; Rischbieter, G.R.C.; Rocchetti, A.; Rosenfeld, S. L.; Rosero, R.; Rupp, N.; Rushton, T.; Saha, S.; Salucci, P.; Sanchez, L.; Sanchez-Lucas, P.; Santone, D.; Santos, J.M.F. dos; Sarnoff, I.; Sartorelli, G.; Sazzad, A.B.M.R.; Scheibelhut, M.; Schnee, R.W.; Schrank, M.; Schreiner, J.; Schulte, P.; Schulte, D.; Eissing, H. Schulze; Schumann, M.; Schwemberger, T.; Schwenk, A.; Schwetz, T.; Lavina, L. Scotto; Scovell, P.R.; Sekiya, H.; Selvi, M.; Semenov, E.; Semeria, F.; Shagin, P.; Shaw, S.; Shi, S.; Shockley, E.; Shutt, T.A.; Si-Ahmed, R.; Silk, J.J.; Silva, C.; Silva, M.C.; Simgen, H.; Šimkovic, F.; Sinev, G.; Singh, R.; Skulski, W.; Smirnov, J.; Smith, R.; Solmaz, M.; Solovov, V.N.; Sorensen, P.; Soria, J.; Sparmann, T.J.; Stancu, I.; Steidl, M.; Stevens, A.; Stifter, K.; Strigari, L.E.; Subotic, D.; Suerfu, B.; Suliga, A.M.; Sumner, T.J.; Szabo, P.; Szydagis, M.; Takeda, A.; Takeuchi, Y.; Tan, P.-L.; Taricco, C.; Taylor, W.C.; Temples, D.J.; Terliuk, A.; Terman, P.A.; Thers, D.; Thieme, K.; Thümmler, T.; Tiedt, D.R.; Timalsina, M.; To, W.H.; Toennies, F.; Tong, Z.; Toschi, F.; Tovey, D.R.; Tranter, J.; Trask, M.; Trinchero, G.C.; Tripathi, M.; Tronstad, D.R.; Trotta, R.; Tsai, Y.D.; Tunnell, C.D.; Turner, W.G.; Ueno, R.; Urquijo, P.; Utku, U.; Vaitkus, A.; Valerius, K.; Vassilev, E.; Vecchi, S.; Velan, V.; Vetter, S.; Vincent, A.C.; Vittorio, L.; Volta, G.; Krosigk, B. von; Piechowski, M. von; Vorkapic, D.; Wagner, C.E.M.; Wang, A.M.; Wang, B.; Wang, Y.; Wang, W.; Wang, J.J.; Wang, L.-T.; Wang, M.; Wang, Y.; Watson, J.R.; Wei, Y.; Weinheimer, C.; Weisman, E.; Weiss, M.; Wenz, D.; West, S.M.; Whitis, T.J.; Williams, M.; Wilson, M.J.; Winkler, D.; Wittweg, C.; Wolf, J.; Wolf, T.; Wolfs, F.L.H.; Woodford, S.; Woodward, D.; Wright, C.J.; Wu, V.H.S.; Wu, P.; Wüstling, S.; Wurm, M.; Xia, Q.; Xiang, X.; Xing, Y.; Xu, J.; Xu, Z.; Xu, D.; Yamashita, M.; Yamazaki, R.; Yan, H.; Yang, L.; Yang, Y.; Ye, J.; Yeh, M.; Young, I.; Yu, H.B.; Yu, T.T.; Yuan, L.; Zavattini, G.; Zerbo, S.; Zhang, Y.; Zhong, M.; Zhou, N.; Zhou, X.; Zhu, T.; Zhu, Y.; Zhuang, Y.; Zopounidis, J.P.; Zuber, K.; Zupan, J.
    The nature of dark matter and properties of neutrinos are among the most pressing issues in contemporary particle physics. The dual-phase xenon time-projection chamber is the leading technology to cover the available parameter space for weakly interacting massive particles, while featuring extensive sensitivity to many alternative dark matter candidates. These detectors can also study neutrinos through neutrinoless double-beta decay and through a variety of astrophysical sources. A next-generation xenon-based detector will therefore be a true multi-purpose observatory to significantly advance particle physics, nuclear physics, astrophysics, solar physics, and cosmology. This review article presents the science cases for such a detector.
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    Effects of etchants in the transfer of chemical vapor deposited graphene
    (AIP, 2018) Wang, M.; Yang, E.H.; Vajtai, R.; Kono, J.; Ajayan, P.M.
    The quality of graphene can be strongly modified during the transfer process following chemical vapor deposition (CVD) growth. Here, we transferred CVD-grown graphene from a copper foil to a SiO2/Si substrate using wet etching with four different etchants: HNO3, FeCl3, (NH4)2S2O8, and a commercial copper etchant. We then compared the quality of graphene after the transfer process in terms of surface modifications, pollutions (residues and contaminations), and electrical properties (mobility and density). Our tests and analyses showed that the commercial copper etchant provides the best structural integrity, the least amount of residues, and the smallest doping carrier concentration.
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    Mixed deformation styles observed on a shallow subduction thrust, Hikurangi margin, New Zealand
    (The Geological Society of America, 2019) Fagereng, Å; Savage, H.M.; Morgan, J.K.; Wang, M.; Meneghini, F.; Barnes, P.M.; Bell, R.; Kitajima, H.; McNamara, D.D.; Saffer, D.M.; Wallace, L.M.; Petronotis, K.; LeVay, L.
    Geophysical observations show spatial and temporal variations in fault slip style on shallow subduction thrust faults, but geological signatures and underlying deformation processes remain poorly understood. International Ocean Discovery Program (IODP) Expeditions 372 and 375 investigated New Zealand’s Hikurangi margin in a region that has experienced both tsunami earthquakes and repeated slow-slip events. We report direct observations from cores that sampled the active Pāpaku splay fault at 304 m below the seafloor. This fault roots into the plate interface and comprises an 18-m-thick main fault underlain by ∼30 m of less intensely deformed footwall and an ∼10-m-thick subsidiary fault above undeformed footwall. Fault zone structures include breccias, folds, and asymmetric clasts within transposed and/or dismembered, relatively homogeneous, silty hemipelagic sediments. The data demonstrate that the fault has experienced both ductile and brittle deformation. This structural variation indicates that a range of local slip speeds can occur along shallow faults, and they are controlled by temporal, potentially far-field, changes in strain rate or effective stress.