Electrical properties of thin film carbon(60) (fullerenes, excimer lasers)

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1355263.PDF (2.45 MB)
Date
1993
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Abstract

The fabrication of solid C\sb60 device structures by vacuum sublimation methods is described. The experimentally determined threshold of intrinsic conductivity of solid C\sb60 is $\sim1.5eV.TheobservationsofohmiccontactandphotoinducedvoltagesinC\sb{60}$ sandwich structures are observed and explained. The diffusion of silver into C\sb60 thin films is quantitatively studied. The activation energy for diffusion of silver into C\sb60 is estimated at 2.5 ± 0.5 eV. Experiments on KrF excimer laser-induced ablation and the laser-induced conductivity change in solid C\sb60 are done for the first time.

Description
Advisor
Halas, Naomi J.
Degree
Master of Science
Type
Thesis
Keywords
Condensed matter physics, Electronics, Electrical engineering, Engineering, Materials science
Citation

Sarkar, Dipankar. "Electrical properties of thin film carbon(60) (fullerenes, excimer lasers)." (1993) Master’s Thesis, Rice University. https://hdl.handle.net/1911/13781.

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https://hdl.handle.net/1911/13781
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Rice University Theses and Dissertations