Nonlinear Dynamics in Atomic Force Microscopy for Various Excitation Conditions

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dc.contributor.advisorDick, Andrew J.en_US
dc.contributor.committeeMemberO' Malley, Marcia K.en_US
dc.contributor.committeeMemberClark, John W.en_US
dc.creatorHuang, Weien_US
dc.date.accessioned2019-05-16T19:48:29Zen_US
dc.date.available2019-05-16T19:48:29Zen_US
dc.date.created2014-12en_US
dc.date.issued2015-05-11en_US
dc.date.submittedDecember 2014en_US
dc.date.updated2019-05-16T19:48:29Zen_US
dc.description.abstractThe atomic force microscopy (AFM) is a high-resolution measurement tool for measuring sample topography and material properties in micro-scale and nano-scale research. The dynamics of the cantilever probe in AFM is influenced by the intrinsically nonlinear interaction between the probe tip and the surface of the sample. Previous work has shown that in off-resonance excited intermittent-contact AFM, a period-doubling bifurcation can occur as a result of the nonlinearity. The amplitude of the resulting sub-harmonic frequency component of the response has been identified as a source of contrast to measure the Young's modulus of the sample. This dissertation details the continued work in this area and includes three parts. In the first part, the focus is to investigate the performance of a material characterization method, proposed to use the relationship between the sample modulus and the sub-harmonic frequency component, to study material property transitions for one-dimensional samples. In the second part, the focus is on the effect of the inclusion of the explicit dissipative interaction force in the system model on the numerical simulation on the AFM. Both resonant and off-resonant excitation conditions are discussed. In the third part, the focus is on the generation of the sub-harmonic amplitude for an unique dual-frequency excitation condition. The influence of this excitation condition is numerically investigated and experimental studies are conducted with a macro-scale constrained cantilevered beam system to qualitatively verify the numerically predicted behavior. The work in this dissertation brings a wider understanding for these nonstandard excitation methods and their applications in AFM.en_US
dc.format.mimetypeapplication/pdfen_US
dc.identifier.citationHuang, Wei. "Nonlinear Dynamics in Atomic Force Microscopy for Various Excitation Conditions." (2015) Diss., Rice University. <a href="https://hdl.handle.net/1911/105441">https://hdl.handle.net/1911/105441</a>.en_US
dc.identifier.urihttps://hdl.handle.net/1911/105441en_US
dc.language.isoengen_US
dc.rightsCopyright is held by the author, unless otherwise indicated. Permission to reuse, publish, or reproduce the work beyond the bounds of fair use or other exemptions to copyright law must be obtained from the copyright holder.en_US
dc.subjectAtomic Force Microscopyen_US
dc.subjectOff-resonance excitationen_US
dc.subjectPeriod-doubling bifurcationen_US
dc.subjectEnergy dissipationen_US
dc.subjectDual-frequency excitationen_US
dc.subjectScaled experimental systemen_US
dc.titleNonlinear Dynamics in Atomic Force Microscopy for Various Excitation Conditionsen_US
dc.typeThesisen_US
dc.type.materialTexten_US
thesis.degree.departmentMechanical Engineeringen_US
thesis.degree.disciplineEngineeringen_US
thesis.degree.grantorRice Universityen_US
thesis.degree.levelDoctoralen_US
thesis.degree.nameDoctor of Philosophyen_US
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