An electron diffraction study of alumina films

dc.creatorSimpson, Warren Candleren_US
dc.date.accessioned2007-08-21T01:08:14Zen_US
dc.date.available2007-08-21T01:08:14Zen_US
dc.date.issued1944en_US
dc.description.abstractIn the work which follows, the changes in structure of natural and electrolytic films brought about by various treatments will be the subject under discussion, and the experimental account will be concerned with the report of some effects encountered in the investigation of these oxide films. The confused and sometimes contradictory nature of the existing evidence regarding the nature and behavior of oxide films on aluminum is considered as sufficient justification for further study of the subject. It is hoped that some of the contradictory results obtained by other investigators may be explained on the basis of their experimental conditions and the interpretation of the data obtained.en_US
dc.format.mimetypeapplication/pdfen_US
dc.identifier.callnoThesis Chem. 1944 Simpsonen_US
dc.identifier.citationSimpson, Warren Candler. "An electron diffraction study of alumina films." (1944) Diss., Rice University. <a href="https://hdl.handle.net/1911/18450">https://hdl.handle.net/1911/18450</a>.en_US
dc.identifier.urihttps://hdl.handle.net/1911/18450en_US
dc.language.isoengen_US
dc.rightsCopyright is held by the author, unless otherwise indicated. Permission to reuse, publish, or reproduce the work beyond the bounds of fair use or other exemptions to copyright law must be obtained from the copyright holder.en_US
dc.subjectCondensed matter physicsen_US
dc.titleAn electron diffraction study of alumina filmsen_US
dc.typeThesisen_US
dc.type.materialTexten_US
thesis.degree.departmentChemistryen_US
thesis.degree.disciplineNatural Sciencesen_US
thesis.degree.grantorRice Universityen_US
thesis.degree.levelDoctoralen_US
thesis.degree.nameDoctor of Philosophyen_US
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