Nosie measurement in strongly correlated systems

dc.contributor.committeeMemberNatelson, Douglasen_US
dc.contributor.committeeMemberDai, Pengchengen_US
dc.contributor.committeeMemberZhu, Hanyuen_US
dc.creatorChen, LiYangen_US
dc.date.accessioned2023-08-09T16:58:12Zen_US
dc.date.available2023-08-09T16:58:12Zen_US
dc.date.created2023-05en_US
dc.date.issued2023-04-17en_US
dc.date.submittedMay 2023en_US
dc.date.updated2023-08-09T16:58:12Zen_US
dc.description.abstractNoise comes from the current or voltage fluctuations in devices. The three most common types of noise are thermal noise, 1/f noise, and shot noise. Correctly interpreting noise signal can provide extra information beyond common electron transport experiments. In this thesis, we used the noise signal to study the strongly correlated materials, and found interesting results in two different systems, a Mott insulator and a strange metal. This thesis starts from introduction of three common types of noise and their applications in Chapter 1, followed by the introduction of the Mott insulator in Chapter 2 and the strange metal in Chapter 3, especially V2O3 and YbRh2Si2 respectively. Then I introduce our noise measurement setup and calibration process in Chapter 4. In Chapter 5, we show our study of percolation and nano second fluctuators in the V2O3 metal insulator transition, through measuring both the low frequency(below 1MHz) and high frequency(10MHz-1GHz) 1/f noise spectrum dependence on bias and temperature. In Chapter 6, we shows our finding of strongly suppressed shot noise intensity in a YbRh2Si2 nanowire compared with a gold nanowire, and this may indicate the lack of well-defined quasiparticles in this strange metal. In Chapter 7, we discussed possible follow-up research based our projects. Supplementary information including probe design and experiments tips are attached in Appendix.en_US
dc.format.mimetypeapplication/pdfen_US
dc.identifier.citationChen, LiYang. "Nosie measurement in strongly correlated systems." (2023) Diss., Rice University. <a href="https://hdl.handle.net/1911/115120">https://hdl.handle.net/1911/115120</a>.en_US
dc.identifier.urihttps://hdl.handle.net/1911/115120en_US
dc.language.isoengen_US
dc.rightsCopyright is held by the author, unless otherwise indicated. Permission to reuse, publish, or reproduce the work beyond the bounds of fair use or other exemptions to copyright law must be obtained from the copyright holder.en_US
dc.subjectstrongly correlated systemsen_US
dc.subjectnoiseen_US
dc.titleNosie measurement in strongly correlated systemsen_US
dc.typeThesisen_US
dc.type.materialTexten_US
thesis.degree.departmentApplied Physicsen_US
thesis.degree.disciplineApplied Physics/Physicsen_US
thesis.degree.grantorRice Universityen_US
thesis.degree.levelDoctoralen_US
thesis.degree.nameDoctor of Philosophyen_US
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