Shot noise measurements in strongly correlated materials

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dc.contributor.advisorNatelson, Douglasen_US
dc.creatorZhou, Panpanen_US
dc.date.accessioned2019-12-06T19:45:14Zen_US
dc.date.available2019-12-06T19:45:14Zen_US
dc.date.created2019-12en_US
dc.date.issued2019-12-05en_US
dc.date.submittedDecember 2019en_US
dc.date.updated2019-12-06T19:45:15Zen_US
dc.description.abstractIn conventional metals where the interaction between electrons is weak, the low energy excitations can be well explained by Landau Fermi liquid theory. However, in many metallic materials with bulk d or f-electrons, such as transition metal oxides, conventional theories fail to effectively describe the electronic or spin properties due to the presence of strong electron-electron interactions. A better understanding of electronic behavior in strongly correlated systems has been a great challenge in modern physics. In this dissertation, I mainly focused on the studying of quasiparticle's effective charge in strongly correlated material by probing the shot noise--a current fuctuation that originates from the discrete nature of charge carriers. We firstly explored methods for fabricating tunnel junctions and found that hexagonal boron nitride (hBN) is a very good candidate for a tunneling barrier. The tunneling device made by Au/hBN/Au has well-behaved shot noise properties that match with single-particle tunneling predictions quantitatively. Shot noise is also studied in highquality LSCO/LCO/LSCO tunnel structures grown by the molecular beam epitaxy (MBE) technique at various doping levels from underdoped to nearly optimum doped. In those devices, the shot noise is found to be larger than single-electron tunneling prediction deep into the pseudogap region of temperature and bias, indicating pairing might exist in the pseudogap phase.en_US
dc.format.mimetypeapplication/pdfen_US
dc.identifier.citationZhou, Panpan. "Shot noise measurements in strongly correlated materials." (2019) Diss., Rice University. <a href="https://hdl.handle.net/1911/107806">https://hdl.handle.net/1911/107806</a>.en_US
dc.identifier.urihttps://hdl.handle.net/1911/107806en_US
dc.language.isoengen_US
dc.rightsCopyright is held by the author, unless otherwise indicated. Permission to reuse, publish, or reproduce the work beyond the bounds of fair use or other exemptions to copyright law must be obtained from the copyright holder.en_US
dc.subjectShot noiseen_US
dc.subjectTunnelingen_US
dc.subjectStrongly correlated materialsen_US
dc.subjectHigh-temperature superconductorsen_US
dc.subjectPseudogapen_US
dc.subjectElectron pairingen_US
dc.titleShot noise measurements in strongly correlated materialsen_US
dc.typeThesisen_US
dc.type.materialTexten_US
thesis.degree.departmentPhysics and Astronomyen_US
thesis.degree.disciplineNatural Sciencesen_US
thesis.degree.grantorRice Universityen_US
thesis.degree.levelDoctoralen_US
thesis.degree.nameDoctor of Philosophyen_US
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