Enhanced super-resolution microscopy by phase modulation

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dc.contributor.advisorLandes, Christy Fen_US
dc.contributor.advisorKelly, Kevin Fen_US
dc.creatorWang, Wenxiaoen_US
dc.date.accessioned2017-07-31T16:34:06Zen_US
dc.date.available2017-07-31T16:34:06Zen_US
dc.date.created2016-12en_US
dc.date.issued2016-08-12en_US
dc.date.submittedDecember 2016en_US
dc.date.updated2017-07-31T16:34:06Zen_US
dc.description.abstractSuper-resolution microscopy typically achieves high 2D spatial resolution but the detection of depth is always difficult. At the same time the temporal resolution remains low and obstructs most biological and chemical researches. In this thesis, I firstly introduced the depth detection method via phase modulation with a 4f system. In the Fourier domain, a phase mask encodes the depth information with a specific phase pattern, double helix phase mask. The final point spread functions deviates from the standard Gaussian point spread functions and the depth information can be measured with high precision by fitting the corresponding double helix point spread functions. Based on the 4f system, I modified the instrument and propose a novel technique Super Temporal-Resolved Microscopy (STReM) to improve the temporal resolution of 2D super-resolution microscopy. The fundamental basis for STReM is the utilization of a double helix phase mask which is rotated at fast speeds to encode temporal information in Fourier domain. The signal can be analyzed either by single emitter fitting or a l_1norm constrained optimization process, which is based on dynamic properties of emitter movement. STReM has been verified using both simulated and experimental 2D data for adsorption/desorption and 2D transport. The temporal resolution has been improved roughly 20 times when comparing traditional methods to that of the novel method of STReM presented in this thesis.en_US
dc.format.mimetypeapplication/pdfen_US
dc.identifier.citationWang, Wenxiao. "Enhanced super-resolution microscopy by phase modulation." (2016) Master’s Thesis, Rice University. <a href="https://hdl.handle.net/1911/95581">https://hdl.handle.net/1911/95581</a>.en_US
dc.identifier.urihttps://hdl.handle.net/1911/95581en_US
dc.language.isoengen_US
dc.rightsCopyright is held by the author, unless otherwise indicated. Permission to reuse, publish, or reproduce the work beyond the bounds of fair use or other exemptions to copyright law must be obtained from the copyright holder.en_US
dc.subjectSuper-resolutionen_US
dc.subjectphase modulationen_US
dc.titleEnhanced super-resolution microscopy by phase modulationen_US
dc.typeThesisen_US
dc.type.materialTexten_US
thesis.degree.departmentElectrical and Computer Engineeringen_US
thesis.degree.disciplineEngineeringen_US
thesis.degree.grantorRice Universityen_US
thesis.degree.levelMastersen_US
thesis.degree.nameMaster of Scienceen_US
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