What's Next for Microelectronics Education - Editorial

dc.citation.firstpage95en_US
dc.citation.issueNumber4en_US
dc.citation.journalTitleIEEE Design and Test of Computersen_US
dc.citation.lastpage102en_US
dc.citation.volumeNumber14en_US
dc.contributor.authorFeinsmith, Jasonen_US
dc.contributor.authorAylor, James H.en_US
dc.contributor.authorHodson, Roberten_US
dc.contributor.authorCourtois, Bernarden_US
dc.contributor.authorCavallaro, Joseph R.en_US
dc.contributor.authorHines, Johnen_US
dc.contributor.authorPina, Cesaren_US
dc.contributor.authorSmith, Michaelen_US
dc.contributor.authorBouldin, Donen_US
dc.contributor.orgCenter for Multimedia Communicationen_US
dc.date.accessioned2012-05-30T19:06:13Zen_US
dc.date.available2012-05-30T19:06:13Zen_US
dc.date.issued1997-12-01en_US
dc.description.abstractWith funding for services like MOSIS shrinking and industry demanding more diverse skills, the microelectronics education infrastructure—indeed that of engineering education in general—is under intense pressure to change. But change without organization and a concrete implementation plan could be disastrous. Participants from academia, government, and industry met to discuss the best way for change to take place and just what is required to make it happen. D&T thanks participants James Aylor (University of Virginia), Joseph Cavallaro (Rice University), Bernard Courtois (CMP), Jason Feinsmith (Xilinx), Robert Hodson (Christopher Newport University), John Hines (US Air Force Wright Laboratories), Cesar Pina, (the MOSIS Service), and Michael Smith (University of Hawaii). We also thank moderator Don Bouldin (University of Tennessee), D&T associate editor Kaushik Roy (Purdue) who organized the event, and the Microelectronic Systems Education Conference, which sponsored it.en_US
dc.description.sponsorshipMicroelectronic Systems Education Conferenceen_US
dc.identifier.citationJ. Feinsmith, J. H. Aylor, R. Hodson, B. Courtois, J. R. Cavallaro, J. Hines, C. Pina, M. Smith and D. Bouldin, "What's Next for Microelectronics Education - Editorial," IEEE Design and Test of Computers, vol. 14, no. 4, 1997.en_US
dc.identifier.urihttps://hdl.handle.net/1911/64197en_US
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.titleWhat's Next for Microelectronics Education - Editorialen_US
dc.typeJournal articleen_US
dc.type.dcmiTexten_US
dc.type.dcmiTexten_US
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