A study of background signals in terahertz apertureless near-field microscopy and their use for scattering-probe imaging

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dc.contributor.advisorMittleman, Daniel M.
dc.creatorAstley, Victoria
dc.date.accessioned2011-07-25T01:38:50Z
dc.date.available2011-07-25T01:38:50Z
dc.date.issued2009
dc.description.abstractApertureless near-field microscopy is an imaging technique in which a small metal tip is held close to a surface, converting evanescent waves to propagating waves and permitting sub-wavelength spatial resolution. In the terahertz region of the spectrum, the interpretation of measured signals and the suppression of background scattering can be complicated by the broad bandwidth of the THz source and by the phase-sensitive detection of the scattered radiation. We have analyzed the use of tip-sample distance modulation for the removal of background signals. We find that significant background signals, originating from scattering off the probe tip, can be observed even after modulation. These background signals result from path-length difference modulation, and thus depend on phase-sensitive detection. We use a dipole antenna model to explain the spatial variation of this signal. Since it originates from the tip only, it can be used to characterize free-space terahertz wave fronts with sub-wavelength resolution.
dc.format.mimetypeapplication/pdf
dc.identifier.callnoTHESIS E.E. 2009 ASTLEY
dc.identifier.citationAstley, Victoria. "A study of background signals in terahertz apertureless near-field microscopy and their use for scattering-probe imaging." (2009) Master’s Thesis, Rice University. <a href="https://hdl.handle.net/1911/61862">https://hdl.handle.net/1911/61862</a>.
dc.identifier.urihttps://hdl.handle.net/1911/61862
dc.language.isoeng
dc.rightsCopyright is held by the author, unless otherwise indicated. Permission to reuse, publish, or reproduce the work beyond the bounds of fair use or other exemptions to copyright law must be obtained from the copyright holder.
dc.subjectElectronics
dc.subjectElectrical engineering
dc.subjectOptics
dc.titleA study of background signals in terahertz apertureless near-field microscopy and their use for scattering-probe imaging
dc.typeThesis
dc.type.materialText
thesis.degree.departmentElectrical Engineering
thesis.degree.disciplineEngineering
thesis.degree.grantorRice University
thesis.degree.levelMasters
thesis.degree.nameMaster of Science
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