A study of background signals in terahertz apertureless near-field microscopy and their use for scattering-probe imaging

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dc.contributor.advisorMittleman, Daniel M.en_US
dc.creatorAstley, Victoriaen_US
dc.date.accessioned2011-07-25T01:38:50Zen_US
dc.date.available2011-07-25T01:38:50Zen_US
dc.date.issued2009en_US
dc.description.abstractApertureless near-field microscopy is an imaging technique in which a small metal tip is held close to a surface, converting evanescent waves to propagating waves and permitting sub-wavelength spatial resolution. In the terahertz region of the spectrum, the interpretation of measured signals and the suppression of background scattering can be complicated by the broad bandwidth of the THz source and by the phase-sensitive detection of the scattered radiation. We have analyzed the use of tip-sample distance modulation for the removal of background signals. We find that significant background signals, originating from scattering off the probe tip, can be observed even after modulation. These background signals result from path-length difference modulation, and thus depend on phase-sensitive detection. We use a dipole antenna model to explain the spatial variation of this signal. Since it originates from the tip only, it can be used to characterize free-space terahertz wave fronts with sub-wavelength resolution.en_US
dc.format.mimetypeapplication/pdfen_US
dc.identifier.callnoTHESIS E.E. 2009 ASTLEYen_US
dc.identifier.citationAstley, Victoria. "A study of background signals in terahertz apertureless near-field microscopy and their use for scattering-probe imaging." (2009) Master’s Thesis, Rice University. <a href="https://hdl.handle.net/1911/61862">https://hdl.handle.net/1911/61862</a>.en_US
dc.identifier.urihttps://hdl.handle.net/1911/61862en_US
dc.language.isoengen_US
dc.rightsCopyright is held by the author, unless otherwise indicated. Permission to reuse, publish, or reproduce the work beyond the bounds of fair use or other exemptions to copyright law must be obtained from the copyright holder.en_US
dc.subjectElectronicsen_US
dc.subjectElectrical engineeringen_US
dc.subjectOpticsen_US
dc.titleA study of background signals in terahertz apertureless near-field microscopy and their use for scattering-probe imagingen_US
dc.typeThesisen_US
dc.type.materialTexten_US
thesis.degree.departmentElectrical Engineeringen_US
thesis.degree.disciplineEngineeringen_US
thesis.degree.grantorRice Universityen_US
thesis.degree.levelMastersen_US
thesis.degree.nameMaster of Scienceen_US
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