Investigating the electronic properties of carbon nanostructures with scanning tunneling microscopy

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dc.contributor.advisorHalas, Naomi J.en_US
dc.creatorKelly, Kevin Francisen_US
dc.date.accessioned2009-06-04T08:37:46Zen_US
dc.date.available2009-06-04T08:37:46Zen_US
dc.date.issued1999en_US
dc.description.abstractUtilizing the scanning tunneling microscope, the electronic and structural properties of a variety of carbon based nanostructures, are explored. Among these, threefold electron scattering on graphite generated by vacancies and adsorbates is imaged using C60-functionalized STM tips. By comparing a simple theoretical model to the experimental results, it is possible to identify the exact location of the defect in the graphite lattice. It is also possible to qualitatively identify the bonding strength of various adsorbates. In addition to graphite, monolayers of disulfide derivatized fullerenes are probed with the STM. The self-assembling and electronic properties of these molecules are investigated. Lastly, comparisons are drawn from these experiments to similar investigations of functionalized carbon nanotubes.en_US
dc.format.extent79 p.en_US
dc.format.mimetypeapplication/pdfen_US
dc.identifier.callnoTHESIS E.E. 1999 KELLYen_US
dc.identifier.citationKelly, Kevin Francis. "Investigating the electronic properties of carbon nanostructures with scanning tunneling microscopy." (1999) Diss., Rice University. <a href="https://hdl.handle.net/1911/19405">https://hdl.handle.net/1911/19405</a>.en_US
dc.identifier.urihttps://hdl.handle.net/1911/19405en_US
dc.language.isoengen_US
dc.rightsCopyright is held by the author, unless otherwise indicated. Permission to reuse, publish, or reproduce the work beyond the bounds of fair use or other exemptions to copyright law must be obtained from the copyright holder.en_US
dc.subjectPhysical chemistryen_US
dc.subjectElectronicsen_US
dc.subjectElectrical engineeringen_US
dc.subjectCondensed matter physicsen_US
dc.titleInvestigating the electronic properties of carbon nanostructures with scanning tunneling microscopyen_US
dc.typeThesisen_US
dc.type.materialTexten_US
thesis.degree.departmentElectrical Engineeringen_US
thesis.degree.disciplineEngineeringen_US
thesis.degree.grantorRice Universityen_US
thesis.degree.levelDoctoralen_US
thesis.degree.nameDoctor of Philosophyen_US
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