An investigation of the mechanism underlying delayed electron emission

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dc.contributor.advisorBrotzen, Franz R.en_US
dc.creatorClayton, Richard Nelsonen_US
dc.date.accessioned2016-04-21T12:01:44Zen_US
dc.date.available2016-04-21T12:01:44Zen_US
dc.date.issued1959en_US
dc.description.abstractElectron emission from aluminum was observed during isochronal annealing after deformation at a low temperature, and during isothermal annealing after quenching from a high temperature. The results were compared with theory. Approximate values of the activation energies for the process were derived. A possible mechanism underlying the phenomenon was suggested. The electrical resistance of aluminum wires was also measured during isochronal annealing after deformation at a low temperature. A mechanism was suggested to explain the results.en_US
dc.format.digitalOriginreformatted digitalen_US
dc.format.extent54 ppen_US
dc.identifier.callnoThesis M.E. 1959 CLAYTONen_US
dc.identifier.citationClayton, Richard Nelson. "An investigation of the mechanism underlying delayed electron emission." (1959) Master’s Thesis, Rice University. <a href="https://hdl.handle.net/1911/89175">https://hdl.handle.net/1911/89175</a>.en_US
dc.identifier.digitalRICE0212en_US
dc.identifier.urihttps://hdl.handle.net/1911/89175en_US
dc.language.isoengen_US
dc.rightsCopyright is held by the author, unless otherwise indicated. Permission to reuse, publish, or reproduce the work beyond the bounds of fair use or other exemptions to copyright law must be obtained from the copyright holder.en_US
dc.titleAn investigation of the mechanism underlying delayed electron emissionen_US
dc.typeThesisen_US
dc.type.materialTexten_US
thesis.degree.departmentMechanical Engineeringen_US
thesis.degree.disciplineEngineeringen_US
thesis.degree.grantorRice Universityen_US
thesis.degree.levelMastersen_US
thesis.degree.nameMaster of Artsen_US
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