An investigation of the mechanism underlying delayed electron emission

dc.contributor.advisorBrotzen, Franz R.
dc.creatorClayton, Richard Nelson
dc.date.accessioned2016-04-21T12:01:44Z
dc.date.available2016-04-21T12:01:44Z
dc.date.issued1959
dc.description.abstractElectron emission from aluminum was observed during isochronal annealing after deformation at a low temperature, and during isothermal annealing after quenching from a high temperature. The results were compared with theory. Approximate values of the activation energies for the process were derived. A possible mechanism underlying the phenomenon was suggested. The electrical resistance of aluminum wires was also measured during isochronal annealing after deformation at a low temperature. A mechanism was suggested to explain the results.
dc.format.digitalOriginreformatted digitalen_US
dc.format.extent54 ppen_US
dc.identifier.callnoThesis M.E. 1959 CLAYTONen_US
dc.identifier.citationClayton, Richard Nelson. "An investigation of the mechanism underlying delayed electron emission." (1959) Master’s Thesis, Rice University. <a href="https://hdl.handle.net/1911/89175">https://hdl.handle.net/1911/89175</a>.
dc.identifier.digitalRICE0212en_US
dc.identifier.urihttps://hdl.handle.net/1911/89175
dc.language.isoeng
dc.rightsCopyright is held by the author, unless otherwise indicated. Permission to reuse, publish, or reproduce the work beyond the bounds of fair use or other exemptions to copyright law must be obtained from the copyright holder.
dc.titleAn investigation of the mechanism underlying delayed electron emission
dc.typeThesis
dc.type.materialText
thesis.degree.departmentMechanical Engineering
thesis.degree.disciplineEngineering
thesis.degree.grantorRice University
thesis.degree.levelMasters
thesis.degree.nameMaster of Arts
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