Influence of Effective Modulus on Period-Doubling Bifurcation in Atomic Force Microscopy: Investigation and Implementation for Sample Characterization

dc.contributor.advisorDick, Andrew J.en_US
dc.creatorHuang, Weien_US
dc.date.accessioned2013-03-08T00:34:32Zen_US
dc.date.available2013-03-08T00:34:32Zen_US
dc.date.issued2011en_US
dc.description.abstractAtomic force microscope (AFM) is an important tool for measuring the topographical and other properties of a sample with nanometer resolution. The cantilever probe of the AFM is influenced by nonlinear interaction forces which act between the probe and the sample. For certain non-standard excitation conditions, this can result in bifurcations in the probe's response. This work numerically examines a period-doubling bifurcation observed to occur for interactions with soft materials. The influence of the sample properties and other conditions on the bifurcation is studied and a method is proposed for sample material characterization. The identified values from simulated 1-D and 2-D scans agree well with the true values. The proposed method does not require the use of special probes and it uses the control algorithm for traditional tapping mode AFM with minor modification. This proposed method could also achieve high scan speeds and prevent strong, destructive interaction forces.en_US
dc.format.extent67 p.en_US
dc.format.mimetypeapplication/pdfen_US
dc.identifier.callnoTHESIS M.E. 2011 HUANGen_US
dc.identifier.citationHuang, Wei. "Influence of Effective Modulus on Period-Doubling Bifurcation in Atomic Force Microscopy: Investigation and Implementation for Sample Characterization." (2011) Master’s Thesis, Rice University. <a href="https://hdl.handle.net/1911/70268">https://hdl.handle.net/1911/70268</a>.en_US
dc.identifier.digitalHuangWen_US
dc.identifier.urihttps://hdl.handle.net/1911/70268en_US
dc.language.isoengen_US
dc.rightsCopyright is held by the author, unless otherwise indicated. Permission to reuse, publish, or reproduce the work beyond the bounds of fair use or other exemptions to copyright law must be obtained from the copyright holder.en_US
dc.subjectApplied sciencesen_US
dc.subjectMechanical engineeringen_US
dc.titleInfluence of Effective Modulus on Period-Doubling Bifurcation in Atomic Force Microscopy: Investigation and Implementation for Sample Characterizationen_US
dc.typeThesisen_US
dc.type.materialTexten_US
thesis.degree.departmentMechanical Engineeringen_US
thesis.degree.disciplineEngineeringen_US
thesis.degree.grantorRice Universityen_US
thesis.degree.levelMastersen_US
thesis.degree.nameMaster of Scienceen_US
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