Near-infrared imaging and optical microscopy by compressive sensing

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dc.contributor.advisorKelly, Kevin F.en_US
dc.creatorSun, Tingen_US
dc.date.accessioned2018-12-03T18:32:32Zen_US
dc.date.available2018-12-03T18:32:32Zen_US
dc.date.issued2009en_US
dc.description.abstractGiven its important role, factors such as sensitivity, resolution, dwell time, and bandwidth limit are critical parameters for detectors in modern optical imaging. A new method known as compressive sensing has emerged, which greatly improves the imaging resolution of these detectors. In our configuration, a digital micromirror device randomly but controllably modulates the light before it is collected at the detector. This process simultaneously compresses the signal because the measurement projects the signal onto a white-noise basis. Subsequently, the data from this incoherent basis is reconstructed into a complete real-space image. Given its compressive nature, far fewer measurements are required than the total number of pixels which greatly decreases the acquisition time of the signal. In addition, the intensity of the compressed signal at the detector is much greater than its raster scan counterpart and therefore results in greater signal sensitivity and improved image quality. These advantages make compressive sensing particularly attractive for use in single-detector near-infrared imaging and white light optical microscopy.en_US
dc.format.extent67 ppen_US
dc.identifier.callnoTHESIS E.E. 2009 SUNen_US
dc.identifier.citationSun, Ting. "Near-infrared imaging and optical microscopy by compressive sensing." (2009) Master’s Thesis, Rice University. <a href="https://hdl.handle.net/1911/103679">https://hdl.handle.net/1911/103679</a>.en_US
dc.identifier.digital304986812en_US
dc.identifier.urihttps://hdl.handle.net/1911/103679en_US
dc.language.isoengen_US
dc.rightsCopyright is held by the author, unless otherwise indicated. Permission to reuse, publish, or reproduce the work beyond the bounds of fair use or other exemptions to copyright law must be obtained from the copyright holder.en_US
dc.subjectElectrical engineeringen_US
dc.subjectApplied sciencesen_US
dc.titleNear-infrared imaging and optical microscopy by compressive sensingen_US
dc.typeThesisen_US
dc.type.materialTexten_US
thesis.degree.departmentElectrical Engineeringen_US
thesis.degree.disciplineEngineeringen_US
thesis.degree.grantorRice Universityen_US
thesis.degree.levelMastersen_US
thesis.degree.nameMaster of Scienceen_US
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