Browsing by Author "Kester, Robert T."

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    Image mapped spectropolarimetry
    (2016-01-19) Kester, Robert T.; Tkaczyk, Tomasz S.; Rice University; United States Patent and Trademark Office
    A method for imaging a sample, the method includes, during a single acquisition event, receiving a first polarization-encoded EM field for a first point and a second polarization-encoded EM field for a second point. The method further includes re-directing the first polarization-encoded EM field along a first pre-determined direction to a first location on a dispersing re-imager and the second polarization-encoded EM field along a second pre-determined direction to a second location on the dispersing re-imager. The method further includes spectrally dispersing the first polarization-encoded EM field to obtain a first spectrum, re-imaging the first spectrum onto a first location on a detector, spectrally dispersing the second polarization-encoded EM field to obtain a second spectrum, re-imaging the second spectrum onto a second location on the detector, and detecting the first re-imaged spectrum and the second re-imaged spectrum.
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    Image mapping spectrometers
    (2014-02-18) Tkaczyk, Tomasz S.; Kester, Robert T.; Gao, Liang; Rice University; United States Patent and Trademark Office
    Devices and methods for hyperspectral and multispectral imaging are discussed. In particular, Image Mapping Spectrometer systems, methods of use, and methods of manufacture are presented. Generally, an image mapping spectrometer comprises an image mapping field unit, a spectral separation unit, and a selective imager. Image mapping spectrometers may be used in spectral imaging of optical samples. In some embodiments, the image mapping field unit of an image mapping spectrometer may be manufactured with surface shaped diamond tools.
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    Snapshot advantage: a review of the light collection improvement for parallel high-dimensional measurement systems
    (Society of Photo-Optical Instrumentation Engineers, 2012) Hagen, Nathan; Kester, Robert T.; Gao, Liang; Tkaczyk, Tomasz S.
    The snapshot advantage is a large increase in light collection efficiency available to highdimensional measurement systems that avoid filtering and scanning. After discussing this advantage in the context of imaging spectrometry, where the greatest effort towards developing snapshot systems has been made, we describe the types of measurements where it is applicable. We then generalize it to the larger context of high-dimensional measurements, where the advantage increases geometrically with measurement dimensionality.