2016-04-212016-04-211972Crowley, James Duane. "A contactless method of measuring the resistivity of semiconductor materials." (1972) Master’s Thesis, Rice University. <a href="https://hdl.handle.net/1911/89244">https://hdl.handle.net/1911/89244</a>.https://hdl.handle.net/1911/89244A study has been made of a contactless technique of measuring resistivity, which uses a time-varying magnetic field to induce eddy currents in a sample and measures the magnetic field produced by the eddy currents. The theoretical basis of this method is studied. An experimental system using a phase discriminating network is developed, and used to measure a voltage induced by the eddy current magnetic field. Data are reported for samples in the range from 0.1 to 11 ohm-cm. This method is predicted to be feasible for measuring resistivities in the range from 10-10 ohm-cm to 10+6 ohm-cm.97 ppengCopyright is held by the author, unless otherwise indicated. Permission to reuse, publish, or reproduce the work beyond the bounds of fair use or other exemptions to copyright law must be obtained from the copyright holder.ThesisRICE0281reformatted digitalThesis E.E. 1972 CROWLEY