2015-05-042015-05-042012-12-25Arumugam, Subramanian, Haas, Peter J., Jampani, Ravindranath Chowdary, Jermaine, Christopher, Perez, Luis L. and Xu, Fei, "Risk analysis for data-intensive stochastic models." Patent US8341180B1. issued 2012-12-25. Retrieved from https://hdl.handle.net/1911/80112.https://hdl.handle.net/1911/80112A risk analysis system and method are provided. The system includes an analyzer for analyzing database instances by executing a query on each database instance and selecting a cutoff value. The analyzer also discards the sets of uncertainty data that yield query-result values below the cutoff value and retains the database instances that yield query-result values above the cutoff value as elite sets. The system also includes a cloner to replicate the elite sets, and a sampler to modify the elite sets so that each elite set is mutually statistically independent while still yielding query-result values above the cutoff value.14 ppengUtility patentUS8341180B1