Zhang, JieDu, Rui-RuiPfeiffer, L.N.West, K.W.2018-02-262018-02-262018Zhang, Jie, Du, Rui-Rui, Pfeiffer, L.N., et al.. "Simultaneous measurements of microwave photoresistance and cyclotron reflection in the multiphoton regime." <i>Physical Review B,</i> 97, no. 3 (2018) American Physical Society: https://doi.org/10.1103/PhysRevB.97.035437.https://hdl.handle.net/1911/99294We simultaneously measure photoresistance with electrical transport and coupled plasmon-cyclotron resonance using microwave reflection spectroscopy in high-mobility GaAs/AlGaAs quantum wells under a perpendicular magnetic field. Multiphoton transitions are revealed as sharp peaks in the resistance and the cyclotron reflection on samples with various carrier densities. Our main finding is that plasmon coupling is relevant in the cyclotron reflection spectrum but has not been observed in the electrical conductivity signal. We discuss possible mechanisms relevant to reflection or dc conductivity signal to explain this discrepancy. We further confirm a trend that more multiphoton features can be observed using higher carrier density samples.engArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.Journal articleSimultaneous-measurementshttps://doi.org/10.1103/PhysRevB.97.035437