Seo, MinahYamaguchi, HisatoMohite, Aditya D.Boubanga-Tombet, StephaneBlancon, Jean-ChristopheNajmaei, SinaAjayan, Pulickel M.Lou, JunTaylor, Antoinette J.Prasankumar, Rohit P.2016-04-042016-04-042016Seo, Minah, Yamaguchi, Hisato, Mohite, Aditya D., et al.. "Ultrafast Optical Microscopy of Single Monolayer Molybdenum Disulfide Flakes." <i>Scientific Reports,</i> 6, (2016) Macmillan Publishers Limited: http://dx.doi.org/10.1038/srep21601.https://hdl.handle.net/1911/88839We have performed ultrafast optical microscopy on single flakes of atomically thin CVD-grown molybdenum disulfide, using non-degenerate femtosecond pump-probe spectroscopy to excite and probe carriers above and below the indirect and direct band gaps. These measurements reveal the influence of layer thickness on carrier dynamics when probing near the band gap. Furthermore, fluence-dependent measurements indicate that carrier relaxation is primarily influenced by surface-related defect and trap states after above-bandgap photoexcitation. The ability to probe femtosecond carrier dynamics in individual flakes can thus give much insight into light-matter interactions in these two-dimensional nanosystems.engThis work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material.Journal articlehttp://dx.doi.org/10.1038/srep21601