Du, LingjieKnez, IvanSullivan, GerardDu, Rui-Rui2015-05-152015-05-152015Du, Lingjie, Knez, Ivan, Sullivan, Gerard, et al.. "Robust Helical Edge Transport in Gated InAs/GaSb Bilayers." <i>Physcial Review Letters,</i> 114, (2015) American Physical Society: 96802. http://dx.doi.org/10.1103/PhysRevLett.114.096802.https://hdl.handle.net/1911/80218We have engineered electron-hole bilayers of inverted InAs/GaSb quantum wells, using dilute silicon impurity doping to suppress residual bulk conductance. We have observed robust helical edge states with wide conductance plateaus precisely quantized to 2e2/h in mesoscopic Hall samples. On the other hand, in larger samples the edge conductance is found to be inversely proportional to the edge length. These characteristics persist in a wide temperature range and show essentially no temperature dependence. The quantized plateaus persist to a 12ᅠT applied in-plane field; the conductance increases from 2e2/h in strong perpendicular fields manifesting chiral edge transport. Our study presents a compelling case for exotic properties of a one-dimensional helical liquid on the edge of InAs/GaSb bilayers.engArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.Robust Helical Edge Transport in Gated InAs/GaSb BilayersJournal articlehttp://dx.doi.org/10.1103/PhysRevLett.114.096802