Zheng, N.J.Rau, C.2015-04-302015-04-301993Zheng, N.J. and Rau, C.. "Scanning-Ion Microscopy with Polarization Analysis (Simpa)." <i>MRS Proceedings,</i> 313, (1993) Cambridge University Press: 723-728. http://dx.doi.org/10.1557/PROC-313-723.https://hdl.handle.net/1911/79704We have developed a novel, high-resolution magnetic imaging technique, scanning-ion microscopy with polarization analysis (SIMP A). In SIMP A, a highly-focused, scanning Ga+ ion beam is used to excite spin-polarized electrons at surfaces of ferromagnetic materials. By measuring the intensity and the spin polarization of the emitted electrons using a newly developed, compact Mott polarimeter, topographic and magnetic images of magnetic structures are obtained. We report on first SIMP A studies on single crystalline Fe samples.engArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.Journal articlehttp://dx.doi.org/10.1557/PROC-313-723